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Leakage current effects on N-MOSFETs after thermal ageing in pulsed life tests.

Mohamed Ali BelaïdAhmed M. NahhasM. GaresK. DaoudOlivier Latry
Published in: Microelectron. J. (2014)
Keyphrases
  • low voltage
  • leakage current
  • electrical properties
  • infrared
  • low cost
  • cost effective
  • daily life