B. Beydoun

Publication Activity (10 Years)

Years Active: 2007-2010
Publications (10 Years): 0

Publications

A. Alaeddine, M. Kadi, K. Daoud, B. Beydoun
Characteristics degradation of the SiGe HBT under electromagnetic field stress. Microelectron. Reliab. 50 (12) (2010)
M. Alwan, B. Beydoun, K. Ketata, M. Zoaeter
Bias temperature instability from gate charge characteristics investigations in N-Channel Power MOSFET. Microelectron. J. 38 (6-7) (2007)
M. Alwan, B. Beydoun, K. Ketata, M. Zoaeter
Gate charge behaviors in N-channel power VDMOSFETs during HEF and PBT stresses. Microelectron. Reliab. 47 (9-11) (2007)