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Gate charge behaviors in N-channel power VDMOSFETs during HEF and PBT stresses.

M. AlwanB. BeydounK. KetataM. Zoaeter
Published in: Microelectron. Reliab. (2007)
Keyphrases
  • multiple input
  • field effect transistors
  • power consumption
  • multi channel
  • multiple access
  • steady state
  • wireless communication systems
  • nano scale