M. Kadi

Publication Activity (10 Years)

Years Active: 2009-2010
Publications (10 Years): 0

Publications

A. Alaeddine, M. Kadi, K. Daoud, B. Beydoun
Characteristics degradation of the SiGe HBT under electromagnetic field stress. Microelectron. Reliab. 50 (12) (2010)
A. Alaeddine, M. Kadi, K. Daoud, B. Mazari
Effects of electromagnetic near-field stress on SiGe HBT's reliability. Microelectron. Reliab. 49 (9-11) (2009)