Login / Signup

Bias temperature instability from gate charge characteristics investigations in N-Channel Power MOSFET.

M. AlwanB. BeydounK. KetataM. Zoaeter
Published in: Microelectron. J. (2007)
Keyphrases
  • multiple input
  • multi channel
  • real time
  • field effect transistors
  • power allocation
  • data sets
  • sensor networks
  • total energy
  • multiple access
  • electrical power