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S-parameter performance degradation in power RF N-LDMOS devices due to hot carrier effects.

Mohamed Ali BelaïdM. GaresK. DaoudPhilippe Eudeline
Published in: Microelectron. Reliab. (2011)
Keyphrases
  • power consumption
  • relevance feedback
  • radio frequency
  • real time
  • genetic algorithm
  • information systems
  • mobile devices
  • parameter settings
  • smart phones
  • machine learning
  • multiscale
  • mobile phone
  • electronic devices