Evaluation of hot-electron effects on critical parameter drifts in power RF LDMOS transistors.

Mohamed Ali Belaïd K. Daoud

Published in: Microelectron. Reliab. (2010)

Keyphrases

power consumption
data sets
gold standard
high power
genetic algorithm
evaluation method
evaluation criteria
evaluation methods
high density
image processing
active learning
parameter values
low power
integrated circuit
optimal parameters