Hyunggoy Oh

Publication Activity (10 Years)

Years Active: 2014-2021
Publications (10 Years): 16

Top Topics

Error Detection

Low Power Consumption

Statistical Significance

Top Venues

IEEE Trans. Computers

IEICE Electron. Express

Publications

Hayoung Lee, Hyunggoy Oh, Sungho Kang
On-Chip Error Detection Reusing Built-In Self-Repair for Silicon Debug. IEEE Access 9 (2021)
Kyunghwan Cho, Jihye Kim, Hyunggoy Oh, Sangjun Lee, Sungho Kang
A New Scan Chain Reordering Method for Low Power Consumption based on Care Bit Density. ISOCC (2019)
Heetae Kim, Hyunggoy Oh, Sangjun Lee, Sungho Kang
Low Power Scan Chain Architecture Based on Circuit Topology. ISOCC (2018)
Hyunggoy Oh, Heetae Kim, Sangjun Lee, Sungho Kang
Dynamic voltage Drop induced Path Delay Analysis for STV and NTV Circuits during At-speed Scan Test. ISOCC (2018)
Jaeil Lim, Hyunggoy Oh, Heetae Kim, Sungho Kang
Thermal Aware Test Scheduling for NTV Circuit. IEEE Trans. Comput. Aided Des. Integr. Circuits Syst. 37 (4) (2018)
Inhyuk Choi, Hyunggoy Oh, Young-Woo Lee, Sungho Kang
Test Resource Reused Debug Scheme to Reduce the Post-Silicon Debug Cost. IEEE Trans. Computers 67 (12) (2018)
Hyunggoy Oh, Inhyuk Choi, Sungho Kang
DRAM-Based Error Detection Method to Reduce the Post-Silicon Debug Time for Multiple Identical Cores. IEEE Trans. Computers 66 (9) (2017)
Hyunggoy Oh, Taewoo Han, Inhyuk Choi, Sungho Kang
An On-Chip Error Detection Method to Reduce the Post-Silicon Debug Time. IEEE Trans. Computers 66 (1) (2017)
Hyunggoy Oh, Heetae Kim, Jaeil Lim, Sungho Kang
A selective error data capture method using on-chip DRAM for silicon debug of multi-core design. ISOCC (2017)
Hyunggoy Oh, Heetae Kim, Jaeil Lim, Sungho Kang
Reconfigurable scan architecture for test power and data volume reduction. IEICE Electron. Express 14 (13) (2017)
Younsun Kim, Hyunggoy Oh, Sungho Kang
Proof of Concept of Home IoT Connected Vehicles. Sensors 17 (6) (2017)
Heetae Kim, Hyunggoy Oh, Jaeil Lim, Sungho Kang
A novel X-filling method for capture power reduction. IEICE Electron. Express 14 (23) (2017)
Taewoo Han, Inhyuk Choi, Hyunggoy Oh, Sungho Kang
Parallelized Network-on-Chip-Reused Test Access Mechanism for Multiple Identical Cores. IEEE Trans. Comput. Aided Des. Integr. Circuits Syst. 35 (7) (2016)
Hyunggoy Oh, Inhyuk Choi, Sungho Kang
A new online test and debug methodology for automotive camera image processing system. APCCAS (2016)
Heetae Kim, Inhyuk Choi, Jaeil Lim, Hyunggoy Oh, Sungho Kang
Process variation-aware bridge fault analysis. ISOCC (2016)
Inhyuk Choi, Hyunggoy Oh, Sungho Kang
Test access mechaism for stack test time reduction of 3-dimensional integrated circuit. APCCAS (2016)
Taewoo Han, Inhyuk Choi, Hyunggoy Oh, Sungho Kang
A Scalable and Parallel Test Access Strategy for NoC-Based Multicore System. ATS (2014)