Reconfigurable scan architecture for test power and data volume reduction.
Hyunggoy OhHeetae KimJaeil LimSungho KangPublished in: IEICE Electron. Express (2017)
Keyphrases
- data collection
- data sets
- real time
- data analysis
- training data
- data reduction
- raw data
- statistical analysis
- data distribution
- experimental data
- data processing
- test data
- statistical significance
- statistical tests
- data objects
- original data
- sensor data
- image data
- small number
- learning algorithm
- data points
- neural network
- management system
- statistical methods
- data structure
- computer systems
- database
- high quality
- computational power