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Jaeil Lim
Publication Activity (10 Years)
Years Active: 2013-2018
Publications (10 Years): 7
Top Topics
Power Reduction
Multicore Processors
Hypothesis Tests
Statistical Methods
Top Venues
IEICE Electron. Express
ISOCC
IEEE Trans. Comput. Aided Des. Integr. Circuits Syst.
ACM Comput. Surv.
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Publications
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Jaeil Lim
,
Hyunggoy Oh
,
Heetae Kim
,
Sungho Kang
Thermal Aware Test Scheduling for NTV Circuit.
IEEE Trans. Comput. Aided Des. Integr. Circuits Syst.
37 (4) (2018)
Hyunggoy Oh
,
Heetae Kim
,
Jaeil Lim
,
Sungho Kang
A selective error data capture method using on-chip DRAM for silicon debug of multi-core design.
ISOCC
(2017)
Hyunggoy Oh
,
Heetae Kim
,
Jaeil Lim
,
Sungho Kang
Reconfigurable scan architecture for test power and data volume reduction.
IEICE Electron. Express
14 (13) (2017)
Heetae Kim
,
Hyunggoy Oh
,
Jaeil Lim
,
Sungho Kang
A novel X-filling method for capture power reduction.
IEICE Electron. Express
14 (23) (2017)
Heetae Kim
,
Inhyuk Choi
,
Jaeil Lim
,
Hyunggoy Oh
,
Sungho Kang
Process variation-aware bridge fault analysis.
ISOCC
(2016)
Hyejeong Hong
,
Jaeil Lim
,
Hyunyul Lim
,
Sungho Kang
Lifetime Reliability Enhancement of Microprocessors: Mitigating the Impact of Negative Bias Temperature Instability.
ACM Comput. Surv.
48 (1) (2015)
Jaeil Lim
,
Hyunyul Lim
,
Sungho Kang
3-D Stacked DRAM Refresh Management With Guaranteed Data Reliability.
IEEE Trans. Comput. Aided Des. Integr. Circuits Syst.
34 (9) (2015)
Hyejeong Hong
,
Jaeil Lim
,
Sungho Kang
Recovery-enhancing task scheduling for multicore processors under NBTI impact.
IEICE Electron. Express
11 (11) (2014)
Hyejeong Hong
,
Jaeil Lim
,
Hyunyul Lim
,
Sungho Kang
Thermal-aware dynamic voltage frequency scaling for many-core processors under process variations.
IEICE Electron. Express
10 (14) (2013)
Hyejeong Hong
,
Jaeil Lim
,
Hyunyul Lim
,
Sungho Kang
Dynamic thermal management for 3D multicore processors under process variations.
IEICE Electron. Express
10 (23) (2013)