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Lifetime Reliability Enhancement of Microprocessors: Mitigating the Impact of Negative Bias Temperature Instability.
Hyejeong Hong
Jaeil Lim
Hyunyul Lim
Sungho Kang
Published in:
ACM Comput. Surv. (2015)
Keyphrases
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positive and negative
risk management
image enhancement
factors that influence
image processing
decision support system
computing power
life span
databases
neural network
information retrieval
artificial intelligence
image analysis
power consumption
data gathering
high impact