Hyunyul Lim

Publication Activity (10 Years)

Years Active: 2013-2020
Publications (10 Years): 12

Top Topics

Network Reliability

Fault Diagnostic

Top Venues

IEEE Trans. Comput. Aided Des. Integr. Circuits Syst.

IEICE Electron. Express

IEEE Trans. Reliab.

Publications

Hyunyul Lim, Minho Cheong, Sungho Kang
Scan-Chain-Fault Diagnosis Using Regressions in Cryptographic Chips for Wireless Sensor Networks. Sensors 20 (17) (2020)
Minho Cheng, Hyunyul Lim, Tae Hyun Kim, Sungho Kang
A Hardware-efficient TSV Repair Scheme Based on Butterfly Topology. ISOCC (2019)
Dongsu Lee, Hyunyul Lim, Tae Hyun Kim, Sungho Kang
Neural Network Reliability Enhancement Approach Using Dropout Underutilization in GPU. TENCON (2018)
Hyunyul Lim, Tae Hyun Kim, Dongsu Lee, Sungho Kang
LARECD: Low area overhead and reliable error correction DMR architecture. ISOCC (2017)
Jaeseok Park, Hyunyul Lim, Sungho Kang
FRESH: A New Test Result Extraction Scheme for Fast TSV Tests. IEEE Trans. Comput. Aided Des. Integr. Circuits Syst. 36 (2) (2017)
Tae Hyun Kim, Hyunyul Lim, Sungho Kang
P-backtracking: A new scan chain diagnosis method with probability. ISOCC (2016)
Wooheon Kang, Changwook Lee, Hyunyul Lim, Sungho Kang
Optimized Built-In Self-Repair for Multiple Memories. IEEE Trans. Very Large Scale Integr. Syst. 24 (6) (2016)
Wooheon Kang, Changwook Lee, Hyunyul Lim, Sungho Kang
A New 3-D Fuse Architecture to Improve Yield of 3-D Memories. IEEE Trans. Comput. Aided Des. Integr. Circuits Syst. 35 (10) (2016)
Hyejeong Hong, Jaeil Lim, Hyunyul Lim, Sungho Kang
Lifetime Reliability Enhancement of Microprocessors: Mitigating the Impact of Negative Bias Temperature Instability. ACM Comput. Surv. 48 (1) (2015)
Hyunyul Lim, Wooheon Kang, Sungyoul Seo, Yong Lee, Sungho Kang
Low power scan bypass technique with test data reduction. ISQED (2015)
Wooheon Kang, Changwook Lee, Hyunyul Lim, Sungho Kang
A 3 Dimensional Built-In Self-Repair Scheme for Yield Improvement of 3 Dimensional Memories. IEEE Trans. Reliab. 64 (2) (2015)
Jaeil Lim, Hyunyul Lim, Sungho Kang
3-D Stacked DRAM Refresh Management With Guaranteed Data Reliability. IEEE Trans. Comput. Aided Des. Integr. Circuits Syst. 34 (9) (2015)
Hyejeong Hong, Jaeil Lim, Hyunyul Lim, Sungho Kang
Thermal-aware dynamic voltage frequency scaling for many-core processors under process variations. IEICE Electron. Express 10 (14) (2013)
Hyejeong Hong, Jaeil Lim, Hyunyul Lim, Sungho Kang
Dynamic thermal management for 3D multicore processors under process variations. IEICE Electron. Express 10 (23) (2013)