Low power scan bypass technique with test data reduction.
Hyunyul LimWooheon KangSungyoul SeoYong LeeSungho KangPublished in: ISQED (2015)
Keyphrases
- test data
- low power
- low cost
- power consumption
- high speed
- test set
- test cases
- power reduction
- training data
- single chip
- high power
- data sets
- vlsi circuits
- wireless transmission
- training set
- digital signal processing
- search based testing
- low power consumption
- training samples
- logic circuits
- vlsi architecture
- error rate
- cmos technology
- mixed signal
- signal processor
- gate array
- training and test data
- object oriented
- relational databases
- feature space
- video sequences
- image processing
- databases