Sungyoul Seo

Publication Activity (10 Years)

Years Active: 2015-2022
Publications (10 Years): 10

Top Topics

Generation Algorithm

Top Venues

IEEE Trans. Comput. Aided Des. Integr. Circuits Syst.

IEEE J. Emerg. Sel. Topics Circuits Syst.

Publications

Youngkwang Lee, Young-Woo Lee, Sungyoul Seo, Sungho Kang
Reduced-Pin-Count BOST for Test-Cost Reduction. IEEE Trans. Comput. Aided Des. Integr. Circuits Syst. 41 (3) (2022)
Keewon Cho, Young-Woo Lee, Sungyoul Seo, Sungho Kang
An Efficient BIRA Utilizing Characteristics of Spare Pivot Faults. IEEE Trans. Comput. Aided Des. Integr. Circuits Syst. 38 (3) (2019)
Keewon Cho, Young-Woo Lee, Sungyoul Seo, Sungho Kang
2-D Failure Bitmap Compression Using Line Fault Marking Method. ISOCC (2018)
Sungyoul Seo, Keewon Cho, Young-Woo Lee, Sungho Kang
A Statistic-Based Scan Chain Reordering for Energy-Quality Scalable Scan Test. IEEE J. Emerg. Sel. Topics Circuits Syst. 8 (3) (2018)
Hyeonchan Lim, Sungyoul Seo, Soyeon Kang, Sungho Kang
Broadcast scan compression based on deterministic pattern generation algorithm. ISQED (2017)
Keewon Cho, Young-Woo Lee, Sungyoul Seo, Sungho Kang
An efficient built-in self-repair scheme for area reduction. ISOCC (2017)
Sungyoul Seo, Hyeonchan Lim, Soyeon Kang, Sungho Kang
Off-chip test architecture for improving multi-site testing efficiency using tri-state decoder and 3V-level encoder. ISQED (2017)
Sungyoul Seo, Yong Lee, Sungho Kang
Tri-State Coding Using Reconfiguration of Twisted Ring Counter for Test Data Compression. IEEE Trans. Comput. Aided Des. Integr. Circuits Syst. 35 (2) (2016)
Junghwan Kim, Young-Woo Lee, Minho Cheong, Sungyoul Seo, Sungho Kang
A test methodology to screen scan-path failures. ISOCC (2016)
Soyeon Kang, Inhyuk Choi, Hyeonchan Lim, Sungyoul Seo, Sungho Kang
Software-based embedded core test using multi-polynomial for test data reduction. ISOCC (2016)
Hyunyul Lim, Wooheon Kang, Sungyoul Seo, Yong Lee, Sungho Kang
Low power scan bypass technique with test data reduction. ISQED (2015)
Sungyoul Seo, Yong Lee, Hyeonchan Lim, Joohwan Lee, Hongbom Yoo, Yojoung Kim, Sungho Kang
Scan Chain Reordering-Aware X-Filling and Stitching for Scan Shift Power Reduction. ATS (2015)
Sungyoul Seo, Yong Lee, Joohwan Lee, Sungho Kang
A scan shifting method based on clock gating of multiple groups for low power scan testing. ISQED (2015)