Keewon Cho

Publication Activity (10 Years)

Years Active: 2013-2022
Publications (10 Years): 10

Top Topics

Matching Scheme

Internal Memory

Defect Classification

Top Venues

IEEE Trans. Very Large Scale Integr. Syst.

IEEE Trans. Reliab.

Publications

Seong Ju Lee, Kyu-Young Kim, Sanghoon Oh, Joonhong Park, Gimoon Hong, Dong Yoon Ka, Kyu-Dong Hwang, Jeongje Park, Kyeong Pil Kang, Jungyeon Kim, Junyeol Jeon, Nahsung Kim, Yongkee Kwon, Kornijcuk Vladimir, Woojae Shin, Jongsoon Won, Minkyu Lee, Hyunha Joo, Haerang Choi, Jaewook Lee, Donguc Ko, Younggun Jun, Keewon Cho, Ilwoong Kim, Choungki Song, Chunseok Jeong, Dae-Han Kwon, Jieun Jang, Il Park, Junhyun Chun, Joohwan Cho
A 1ynm 1.25V 8Gb, 16Gb/s/pin GDDR6-based Accelerator-in-Memory supporting 1TFLOPS MAC Operation and Various Activation Functions for Deep-Learning Applications. ISSCC (2022)
Hayoung Lee, Keewon Cho, Sungho Kang, Wooheon Kang, Seungtaek Lee, Woosik Jeong
Fail Memory Configuration Set for RA Estimation. ITC (2020)
Keewon Cho, Young-Woo Lee, Sungyoul Seo, Sungho Kang
An Efficient BIRA Utilizing Characteristics of Spare Pivot Faults. IEEE Trans. Comput. Aided Des. Integr. Circuits Syst. 38 (3) (2019)
Keewon Cho, Young-Woo Lee, Sungyoul Seo, Sungho Kang
2-D Failure Bitmap Compression Using Line Fault Marking Method. ISOCC (2018)
Hayoung Lee, Jooyoung Kim, Keewon Cho, Sungho Kang
Fast Built-In Redundancy Analysis Based on Sequential Spare Line Allocation. IEEE Trans. Reliab. 67 (1) (2018)
Sungyoul Seo, Keewon Cho, Young-Woo Lee, Sungho Kang
A Statistic-Based Scan Chain Reordering for Energy-Quality Scalable Scan Test. IEEE J. Emerg. Sel. Topics Circuits Syst. 8 (3) (2018)
Jooyoung Kim, Woosung Lee, Keewon Cho, Sungho Kang
Hardware-Efficient Built-In Redundancy Analysis for Memory With Various Spares. IEEE Trans. Very Large Scale Integr. Syst. 25 (3) (2017)
Keewon Cho, Young-Woo Lee, Sungyoul Seo, Sungho Kang
An efficient built-in self-repair scheme for area reduction. ISOCC (2017)
Keewon Cho, Jooyoung Kim, Hayoung Lee, Sungho Kang
Discussion of cost-effective redundancy architectures. ISOCC (2016)
Keewon Cho, Wooheon Kang, Hyungjun Cho, Changwook Lee, Sungho Kang
A Survey of Repair Analysis Algorithms for Memories. ACM Comput. Surv. 49 (3) (2016)
Woosung Lee, Keewon Cho, Jooyoung Kim, Sungho Kang
Near optimal repair rate built-in redundancy analysis with very small hardware overhead. ISQED (2015)
Hyungsu Sung, Keewon Cho, Kunsang Yoon, Sungho Kang
A Delay Test Architecture for TSV With Resistive Open Defects in 3-D Stacked Memories. IEEE Trans. Very Large Scale Integr. Syst. 22 (11) (2014)
Wooheon Kang, Changwook Lee, Keewon Cho, Sungho Kang
A Die Selection and Matching Method with Two Stages for Yield Enhancement of 3-D Memories. Asian Test Symposium (2013)