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A Statistic-Based Scan Chain Reordering for Energy-Quality Scalable Scan Test.

Sungyoul SeoKeewon ChoYoung-Woo LeeSungho Kang
Published in: IEEE J. Emerg. Sel. Topics Circuits Syst. (2018)
Keyphrases
  • scan data
  • high quality
  • real world
  • test cases
  • real time
  • data sets
  • neural network
  • information systems
  • decision trees
  • energy consumption
  • test data
  • highly scalable