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A Statistic-Based Scan Chain Reordering for Energy-Quality Scalable Scan Test.
Sungyoul Seo
Keewon Cho
Young-Woo Lee
Sungho Kang
Published in:
IEEE J. Emerg. Sel. Topics Circuits Syst. (2018)
Keyphrases
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scan data
high quality
real world
test cases
real time
data sets
neural network
information systems
decision trees
energy consumption
test data
highly scalable