A Die Selection and Matching Method with Two Stages for Yield Enhancement of 3-D Memories.
Wooheon KangChangwook LeeKeewon ChoSungho KangPublished in: Asian Test Symposium (2013)
Keyphrases
- high accuracy
- experimental evaluation
- dynamic programming
- high precision
- fully automatic
- computational cost
- cost function
- neural network
- selection algorithm
- probabilistic model
- prior knowledge
- preprocessing
- selection scheme
- matching strategy
- selection strategy
- feature matching
- matching scheme
- map matching
- classification method
- matching algorithm
- synthetic data
- feature points
- input data
- support vector machine
- significant improvement
- object recognition
- similarity measure
- image segmentation
- feature selection