Hyeonchan Lim

Publication Activity (10 Years)

Years Active: 2015-2024
Publications (10 Years): 15

Top Topics

Software Architecture

Top Venues

IEEE Trans. Comput. Aided Des. Integr. Circuits Syst.

IEEE Trans. Circuits Syst. II Express Briefs

Publications

Hyeonchan Lim, Tae-Hyun Kim, Sungho Kang
Reconfigurable Multi-Bit Scan Flip-Flop for Cell-Aware Diagnosis. IEEE Trans. Circuits Syst. II Express Briefs 71 (4) (2024)
Hyeonchan Lim, Hyojoon Yun, Juyong Lee, Sungho Kang
Cell-Aware Scan Diagnosis Using Partially Synchronous Set and Reset. ISOCC (2022)
Hyeonchan Lim, Hyojoon Yun, Sungho Kang
Scan Cell Modification for Intra Cell-Aware Scan Chain Diagnosis. IEEE Trans. Circuits Syst. II Express Briefs 69 (11) (2022)
Hyeonchan Lim, Hyojoon Yun, Sungho Kang
A Hybrid Test Scheme for Automotive IC in Multisite Testing. IEEE Trans. Comput. Aided Des. Integr. Circuits Syst. 41 (12) (2022)
Tae Hyun Kim, Hyeonchan Lim, Minho Cheong, Hyojoon Yun, Sungho Kang
Logic Diagnosis Based on Deep Learning for Multiple Faults. ISOCC (2022)
Jungil Mok, Hyeonchan Lim, Sungho Kang
Enhanced Postbond Test Architecture for Bridge Defects Between the TSVs. IEEE Trans. Very Large Scale Integr. Syst. 29 (6) (2021)
Young-Woo Lee, Hyeonchan Lim, Youngkwang Lee, Sungho Kang
Robust Secure Shield Architecture for Detection and Protection Against Invasive Attacks. IEEE Trans. Comput. Aided Des. Integr. Circuits Syst. 39 (10) (2020)
Hyeonchan Lim, Tae Hyun Kim, Seunghwan Kim, Sungho Kang
Diagnosis of Scan Chain Faults Based-on Machine-Learning. ISOCC (2020)
Hyeonchan Lim, Seokjun Jang, Sungho Kang
A Software-based Scan Chain Diagnosis for Double Faults in A Scan Chain. ISOCC (2018)
Hyeonchan Lim, Sungyoul Seo, Soyeon Kang, Sungho Kang
Broadcast scan compression based on deterministic pattern generation algorithm. ISQED (2017)
Hyeonchan Lim, Junghwan Kim, Soyeon Kang, Sungho Kang
Test data reduction method based on berlekamp-massey algorithm. ISOCC (2017)
Young-Woo Lee, Hyeonchan Lim, Sungho Kang
Grouping-Based TSV Test Architecture for Resistive Open and Bridge Defects in 3-D-ICs. IEEE Trans. Comput. Aided Des. Integr. Circuits Syst. 36 (10) (2017)
Sungyoul Seo, Hyeonchan Lim, Soyeon Kang, Sungho Kang
Off-chip test architecture for improving multi-site testing efficiency using tri-state decoder and 3V-level encoder. ISQED (2017)
Soyeon Kang, Inhyuk Choi, Hyeonchan Lim, Sungyoul Seo, Sungho Kang
Software-based embedded core test using multi-polynomial for test data reduction. ISOCC (2016)
Sungyoul Seo, Yong Lee, Hyeonchan Lim, Joohwan Lee, Hongbom Yoo, Yojoung Kim, Sungho Kang
Scan Chain Reordering-Aware X-Filling and Stitching for Scan Shift Power Reduction. ATS (2015)