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Grouping-Based TSV Test Architecture for Resistive Open and Bridge Defects in 3-D-ICs.

Young-Woo LeeHyeonchan LimSungho Kang
Published in: IEEE Trans. Comput. Aided Des. Integr. Circuits Syst. (2017)
Keyphrases
  • real time
  • management system
  • software architecture
  • social networks
  • feature extraction
  • network architecture
  • case study
  • multi agent systems
  • expert systems
  • statistical tests
  • software testing
  • distributed processing