Diagnosis of Scan Chain Faults Based-on Machine-Learning.
Hyeonchan LimTae Hyun KimSeunghwan KimSungho KangPublished in: ISOCC (2020)
Keyphrases
- machine learning
- fault diagnosis
- model based diagnosis
- fault detection
- multiple faults
- fault detection and diagnosis
- fault model
- fault identification
- pattern recognition
- natural language processing
- machine learning algorithms
- fault localization
- machine learning methods
- semi supervised learning
- active learning
- explanation based learning
- decision trees
- computer vision
- data mining
- learning algorithm
- root cause
- medical diagnosis
- artificial intelligence
- text mining
- expert systems
- fault detection and isolation
- neural network
- fault models
- knowledge acquisition
- automatic diagnosis
- natural language
- text classification
- computational intelligence
- diagnostic reasoning
- model based reasoning
- support vector machine
- inductive learning
- supervised machine learning
- machine learning approaches
- feature selection
- dynamic systems
- inductive logic programming
- learning tasks
- reinforcement learning
- learning systems
- data sets
- data analysis
- model selection
- information extraction
- knowledge discovery