A Hybrid Test Scheme for Automotive IC in Multisite Testing.
Hyeonchan LimHyojoon YunSungho KangPublished in: IEEE Trans. Comput. Aided Des. Integr. Circuits Syst. (2022)
Keyphrases
- test generation
- test cases
- test data
- software testing
- test sequences
- statistical tests
- data sets
- integration testing
- test case generation
- test data generation
- learning scheme
- machine learning
- classification scheme
- integrated circuit
- test set
- secret sharing scheme
- regression testing
- item response theory
- test driven development
- test suite
- software development
- data structure
- genetic algorithm
- usability testing
- information retrieval
- real time