Inhyuk Choi

Publication Activity (10 Years)

Years Active: 2011-2023
Publications (10 Years): 14

Top Topics

Error Detection

Semantic Caching

Top Venues

IEEE Trans. Computers

Publications

Yoona Kim, Inhyuk Choi, Juhyung Park, Jaeheon Lee, Sungjin Lee, Jihong Kim
Integrated Host-SSD Mapping Table Management for Improving User Experience of Smartphones. FAST (2023)
Dusol Lee, Inhyuk Choi, Chanyoung Lee, Sungjin Lee, Jihong Kim
P2Cache: An Application-Directed Page Cache for Improving Performance of Data-Intensive Applications. HotStorage (2023)
Sanggu Lee, Yoona Kim, Dusol Lee, Inhyuk Choi, Jihong Kim
Alohomora: protecting files from ransomware attacks using fine-grained I/O whitelisting. HotStorage (2022)
Taeyong Kim, Simpy Sanyal, Ja-Bin Koo, Ju-Am Son, Inhyuk Choi, Junsin Yi
Analysis of Thermal Sensitivity by High Voltage Insulator Materials. IEEE Access 8 (2020)
Inhyuk Choi, Hyunggoy Oh, Young-Woo Lee, Sungho Kang
Test Resource Reused Debug Scheme to Reduce the Post-Silicon Debug Cost. IEEE Trans. Computers 67 (12) (2018)
Hyunggoy Oh, Inhyuk Choi, Sungho Kang
DRAM-Based Error Detection Method to Reduce the Post-Silicon Debug Time for Multiple Identical Cores. IEEE Trans. Computers 66 (9) (2017)
Hyunggoy Oh, Taewoo Han, Inhyuk Choi, Sungho Kang
An On-Chip Error Detection Method to Reduce the Post-Silicon Debug Time. IEEE Trans. Computers 66 (1) (2017)
Young-Woo Lee, Inhyuk Choi, Kang-Hoon Oh, James Jinsoo Ko, Sungho Kang
Test item priority estimation for high parallel test efficiency under ATE debug time constraints. ITC-Asia (2017)
Taewoo Han, Inhyuk Choi, Hyunggoy Oh, Sungho Kang
Parallelized Network-on-Chip-Reused Test Access Mechanism for Multiple Identical Cores. IEEE Trans. Comput. Aided Des. Integr. Circuits Syst. 35 (7) (2016)
Soyeon Kang, Inhyuk Choi, Hyeonchan Lim, Sungyoul Seo, Sungho Kang
Software-based embedded core test using multi-polynomial for test data reduction. ISOCC (2016)
Hyunggoy Oh, Inhyuk Choi, Sungho Kang
A new online test and debug methodology for automotive camera image processing system. APCCAS (2016)
Heetae Kim, Inhyuk Choi, Jaeil Lim, Hyunggoy Oh, Sungho Kang
Process variation-aware bridge fault analysis. ISOCC (2016)
Inhyuk Choi, Hyunggoy Oh, Sungho Kang
Test access mechaism for stack test time reduction of 3-dimensional integrated circuit. APCCAS (2016)
Young-Woo Lee, Junghwan Kim, Inhyuk Choi, Sungho Kang
A TSV test structure for simultaneously detecting resistive open and bridge defects in 3D-ICs. ISOCC (2016)
Taewoo Han, Inhyuk Choi, Sungho Kang
Majority-Based Test Access Mechanism for Parallel Testing of Multiple Identical Cores. IEEE Trans. Very Large Scale Integr. Syst. 23 (8) (2015)
Taewoo Han, Inhyuk Choi, Hyunggoy Oh, Sungho Kang
A Scalable and Parallel Test Access Strategy for NoC-Based Multicore System. ATS (2014)
Taewoo Han, Inhyuk Choi, Sungho Kang
A novel test access mechanism for parallel testing of multi-core system. IEICE Electron. Express 11 (6) (2014)
Inhyuk Choi, Taewoo Han, Sungho Kang
Bit transmission error correction scheme for FlexRay based automotive communication systems. GCCE (2013)
Inhyuk Choi, Taewoo Han, Ilwoong Kim, Sungho Kang
Path search engine for fast optimal path search using efficient hardware architecture. ISOCC (2011)