An On-Chip Error Detection Method to Reduce the Post-Silicon Debug Time.

Hyunggoy Oh Taewoo Han Inhyuk Choi Sungho Kang

Published in: IEEE Trans. Computers (2017)

Keyphrases

detection method
high density
high speed
low cost
detection algorithm
face detection
feature detection
cmos technology
error rate
low power
training data
saliency detection