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DRAM-Based Error Detection Method to Reduce the Post-Silicon Debug Time for Multiple Identical Cores.
Hyunggoy Oh
Inhyuk Choi
Sungho Kang
Published in:
IEEE Trans. Computers (2017)
Keyphrases
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detection method
detection algorithm
face detection
high density
feature detection
high speed
error rate
three dimensional
region detection
saliency detection