Test Resource Reused Debug Scheme to Reduce the Post-Silicon Debug Cost.

Inhyuk Choi Hyunggoy Oh Young-Woo Lee Sungho Kang

Published in: IEEE Trans. Computers (2018)

Keyphrases

parallel programming
low cost
high cost
maintenance cost
cost reduction
novice programmers
cost sensitive
expected cost
storage cost
allocation scheme
pruning power
neural network
high speed
total cost
bandwidth consumption