Scan Cell Modification for Intra Cell-Aware Scan Chain Diagnosis.

Hyeonchan Lim Hyojoon Yun Sungho Kang

Published in: IEEE Trans. Circuits Syst. II Express Briefs (2022)

Keyphrases

scan data
microscopic images
fault diagnosis
real time
data structure
stem cell
data mining
computer vision
information systems
website
expert systems
microscopy images
microscope images
scan path