Thermal Aware Test Scheduling for NTV Circuit.

Jaeil Lim Hyunggoy Oh Heetae Kim Sungho Kang

Published in: IEEE Trans. Comput. Aided Des. Integr. Circuits Syst. (2018)

Keyphrases

scheduling problem
high speed
infrared
resource constraints
test cases
scheduling algorithm
circuit design
genetic algorithm
multi agent
lower bound
round robin
flexible manufacturing systems
dynamic scheduling