On-Chip Error Detection Reusing Built-In Self-Repair for Silicon Debug.

Hayoung Lee Hyunggoy Oh Sungho Kang

Published in: IEEE Access (2021)

Keyphrases

error detection
fault isolation
error correction
high density
high speed
low cost
error recovery
fault tolerance
data cleansing
error correcting
cmos technology
error resilient
analog vlsi
fault tolerant
metal oxide semiconductor
error control
single chip
fault diagnosis
peer to peer