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En-xia Zhang
Publication Activity (10 Years)
Years Active: 2008-2023
Publications (10 Years): 3
Top Topics
X Ray Images
Monte Carlo Simulation
Structuring Elements
Guide Wire
Top Venues
IRPS
DRC
ASICON
Microelectron. Reliab.
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Publications
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Sajal Islam
,
Aditha S. Senarath
,
Arijit Sengupta
,
En-xia Zhang
,
Dennis R. Ball
,
Daniel M. Fleetwood
,
Ronald D. Schrimpf
,
Esmat Farzana
,
Arkka Bhattacharyya
,
Nolan S. Hendricks
,
James S. Speck
Single-Event Burnout by Cf-252 Irradiation in Vertical $\beta$-Ga2O3 Diodes with Pt and PtOx Schottky Contacts and High Permittivity Dielectric Field Plate.
DRC
(2023)
Peng Wang
,
En-xia Zhang
,
Daniel M. Fleetwood
,
Peng Fei Wang
,
Michael W. McCurdy
,
Ji-Tzouh Lin
,
Michael L. Alles
,
Jim L. Davidson
,
Bruce W. Alphenaar
,
Ronald D. Schrimpf
Effects of Charge Generation and Trapping on the X-ray Response of Strained AlGaN/GaN HEMTs.
ASICON
(2021)
A. Sasikumar
,
Z. Zhang
,
P. Kumar
,
En-xia Zhang
,
Daniel M. Fleetwood
,
Ronald D. Schrimpf
,
Paul Saunier
,
Cathy Lee
,
S. A. Ringel
,
A. R. Arehart
Proton irradiation-induced traps causing VT instabilities and RF degradation in GaN HEMTs.
IRPS
(2015)
Cher Xuan Zhang
,
En-xia Zhang
,
Daniel M. Fleetwood
,
Michael L. Alles
,
Ronald D. Schrimpf
,
Chris Rutherglen
,
Kosmas Galatsis
Total-ionizing-dose effects and reliability of carbon nanotube FET devices.
Microelectron. Reliab.
54 (11) (2014)
R. Arinero
,
En-xia Zhang
,
Nadia Rezzak
,
Ronald D. Schrimpf
,
Daniel M. Fleetwood
,
B. K. Choï
,
A. B. Hmelo
,
Julien Mekki
,
Antoine D. Touboul
,
Frédéric Saigné
High fluence 1.8 MeV proton irradiation effects on n-type MOS capacitors.
Microelectron. Reliab.
51 (12) (2011)
Tania Roy
,
Yevgeniy S. Puzyrev
,
En-xia Zhang
,
Sandeepan DasGupta
,
Sarah A. Francis
,
Daniel M. Fleetwood
,
Ronald D. Schrimpf
,
Umesh K. Mishra
,
Jim S. Speck
,
Sokrates T. Pantelides
-rich conditions.
Microelectron. Reliab.
51 (2) (2011)
Wei He
,
Zheng-xuan Zhang
,
En-xia Zhang
,
Wenjie Yu
,
Hao Tian
,
Xi Wang
Practical considerations in the design of SRAM cells on SOI.
Microelectron. J.
39 (12) (2008)