Effects of Charge Generation and Trapping on the X-ray Response of Strained AlGaN/GaN HEMTs.
Peng WangEn-xia ZhangDaniel M. FleetwoodPeng Fei WangMichael W. McCurdyJi-Tzouh LinMichael L. AllesJim L. DavidsonBruce W. AlphenaarRonald D. SchrimpfPublished in: ASICON (2021)