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Proton irradiation-induced traps causing VT instabilities and RF degradation in GaN HEMTs.

A. SasikumarZ. ZhangP. KumarEn-xia ZhangDaniel M. FleetwoodRonald D. SchrimpfPaul SaunierCathy LeeS. A. RingelA. R. Arehart
Published in: IRPS (2015)
Keyphrases
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