Login / Signup

Total-ionizing-dose effects and reliability of carbon nanotube FET devices.

Cher Xuan ZhangEn-xia ZhangDaniel M. FleetwoodMichael L. AllesRonald D. SchrimpfChris RutherglenKosmas Galatsis
Published in: Microelectron. Reliab. (2014)
Keyphrases
  • carbon nanotubes
  • neural network
  • mobile devices
  • data sets
  • embedded systems
  • image processing
  • case study
  • positive effects
  • failure modes