Single-Event Burnout by Cf-252 Irradiation in Vertical $\beta$-Ga2O3 Diodes with Pt and PtOx Schottky Contacts and High Permittivity Dielectric Field Plate.
Sajal IslamAditha S. SenarathArijit SenguptaEn-xia ZhangDennis R. BallDaniel M. FleetwoodRonald D. SchrimpfEsmat FarzanaArkka BhattacharyyaNolan S. HendricksJames S. SpeckPublished in: DRC (2023)