Classification and Test Generation for Path-Delay Faults Using Single Stuck-Fault Tests.
Marwan A. GharaybehMichael L. BushnellVishwani D. AgrawalPublished in: ITC (1995)
Keyphrases
- test generation
- test cases
- mutation testing
- fault diagnosis
- fault detection
- symbolic execution
- design automation
- test sequences
- feature selection
- quality assurance
- static analysis
- multiple faults
- decision trees
- shortest path
- training set
- expert systems
- test data generation
- fault model
- code coverage
- machine learning
- test set
- neural network
- regression testing
- multi agent
- image processing
- fault detection and isolation