Capture-Pattern-Control to Address the Fault Detection Degradation Problem of Multi-cycle Test in Logic BIST.
Senling WangTomoki AonoYoshinobu HigamiHiroshi TakahashiHiroyuki IwataYoichi MaedaJun MatsushimaPublished in: ATS (2018)
Keyphrases
- fault detection
- built in self test
- industrial processes
- fault diagnosis
- fault identification
- fault isolation
- condition monitoring
- tennessee eastman
- integrated circuit
- failure detection
- fuel cell
- control system
- rotating machinery
- control method
- fault localization
- fault detection and diagnosis
- robust fault detection
- fault detection and isolation
- power plant
- test cases
- computer simulation
- case based reasoning
- expert systems