Tomoki Aono

Publication Activity (10 Years)

Years Active: 2018-2020
Publications (10 Years): 2

Top Topics

Industrial Processes

Fault Detection

Tennessee Eastman

Top Venues

IEICE Trans. Inf. Syst.

Publications

Hanan T. Al-Awadhi, Tomoki Aono, Senling Wang, Yoshinobu Higami, Hiroshi Takahashi, Hiroyuki Iwata, Yoichi Maeda, Jun Matsushima
FF-Control Point Insertion (FF-CPI) to Overcome the Degradation of Fault Detection under Multi-Cycle Test for POST. IEICE Trans. Inf. Syst. (11) (2020)
Senling Wang, Tomoki Aono, Yoshinobu Higami, Hiroshi Takahashi, Hiroyuki Iwata, Yoichi Maeda, Jun Matsushima
Capture-Pattern-Control to Address the Fault Detection Degradation Problem of Multi-cycle Test in Logic BIST. ATS (2018)