SAT-Based Test Generation for Open Faults Using Fault Excitation Caused by Effect of Adjacent Lines.
Jun YamashitaHiroyuki YotsuyanagiMasaki HashizumeKozo KinoshitaPublished in: IEICE Trans. Fundam. Electron. Commun. Comput. Sci. (2013)
Keyphrases
- test generation
- test cases
- fault diagnosis
- fault detection
- mutation testing
- multiple faults
- fault model
- test sequences
- symbolic execution
- fault detection and isolation
- design automation
- software testing
- answer set programming
- fault isolation
- fault models
- static analysis
- quality assurance
- constraint solver
- test data generation
- model based diagnosis
- query processing
- planning problems
- complex systems
- repair actions