Launch-on-Shift Test Generation for Testing Scan Designs Containing Synchronous and Asynchronous Clock Domains.
Shianling WuLaung-Terng WangXiaoqing WenWen-Ben JoneMichael S. HsiaoFangfang LiJames Chien-Mo LiJiun-Lang HuangPublished in: ACM Trans. Design Autom. Electr. Syst. (2012)
Keyphrases
- test generation
- test cases
- symbolic execution
- test sequences
- design automation
- software testing
- quality assurance
- mutation testing
- code coverage
- real world
- static analysis
- high speed
- database
- life cycle
- testing process
- test data generation
- regression testing
- high quality
- test suite
- test data
- monitoring system
- relational databases
- information systems