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Test generation for primitive path delay faults in combinational circuits.
Ramesh C. Tekumalla
Premachandran R. Menon
Published in:
ICCAD (1997)
Keyphrases
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test generation
test cases
mutation testing
logic circuits
power dissipation
test sequences
symbolic execution
asynchronous circuits
design automation
software testing
quality assurance
static analysis
fault detection
built in self test
shortest path
fault diagnosis
low power
high speed
test suite
fault models
model based diagnosis
destination node
fault model
artificial intelligence
test data generation
database
test set
databases
real world
learning algorithm
image processing
multicast tree
decision trees
case study
high level
relational databases
open source
bit rate