Test generation for primitive path delay faults in combinational circuits.
Ramesh C. TekumallaPremachandran R. MenonPublished in: ICCAD (1997)
Keyphrases
- test generation
- test cases
- mutation testing
- logic circuits
- power dissipation
- test sequences
- symbolic execution
- asynchronous circuits
- design automation
- software testing
- quality assurance
- static analysis
- fault detection
- built in self test
- shortest path
- fault diagnosis
- low power
- high speed
- test suite
- fault models
- model based diagnosis
- destination node
- fault model
- artificial intelligence
- test data generation
- database
- test set
- databases
- real world
- learning algorithm
- image processing
- multicast tree
- decision trees
- case study
- high level
- relational databases
- open source
- bit rate