ATPG-XP: Test Generation for Maximal Crosstalk-Induced Faults.
Sunghoon ChunTaejin KimSungho KangPublished in: IEEE Trans. Comput. Aided Des. Integr. Circuits Syst. (2009)
Keyphrases
- test generation
- test cases
- mutation testing
- test sequences
- design automation
- symbolic execution
- software testing
- quality assurance
- fault diagnosis
- static analysis
- correlation analysis
- regression testing
- fault detection
- test set
- object oriented
- artificial intelligence
- code coverage
- machine learning
- test suite
- real world
- machine vision
- software process
- high level
- fault model