Sunghoon Chun

Publication Activity (10 Years)

Years Active: 2003-2010
Publications (10 Years): 0

Publications

Sunghoon Chun, Alex Orailoglu
DiSC: A New Diagnosis Method for Multiple Scan Chain Failures. IEEE Trans. Comput. Aided Des. Integr. Circuits Syst. 29 (12) (2010)
Sunghoon Chun, YongJoon Kim, Taejin Kim, Sungho Kang
A High-Level Signal Integrity Fault Model and Test Methodology for Long On-Chip Interconnections. VTS (2009)
Sunghoon Chun, Taejin Kim, Sungho Kang
ATPG-XP: Test Generation for Maximal Crosstalk-Induced Faults. IEEE Trans. Comput. Aided Des. Integr. Circuits Syst. 28 (9) (2009)
Sunghoon Chun, YongJoon Kim, Taejin Kim, Myung-Hoon Yang, Sungho Kang
XPDF-ATPG: An Efficient Test Pattern Generation for Crosstalk-Induced Faults. ATS (2008)
Sunghoon Chun, Taejin Kim, Sungho Kang
A new low energy BIST using a statistical code. ASP-DAC (2008)
Junghyun Nam, Sunghoon Chun, Gibum Koo, Yanggi Kim, Byungsoo Moon, Jonghyoung Lim, Jaehoon Joo, Sangseok Kang, Hoonjung Kim, Kyeongseon Shin, Kisang Kang, Sungho Kang
A New Wafer Level Latent Defect Screening Methodology for Highly Reliable DRAM Using a Response Surface Method. ITC (2008)
Sunghoon Chun, Taejin Kim, YongJoon Kim, Sungho Kang
An Efficient Scan Chain Diagnosis Method Using a New Symbolic Simulation. VTS (2008)
Myung-Hoon Yang, YongJoon Kim, Sunghoon Chun, Sungho Kang
An Effective Power Reduction Methodology for Deterministic BIST Using Auxiliary LFSR. J. Electron. Test. 24 (6) (2008)
Taejin Kim, Sunghoon Chun, YongJoon Kim, Myung-Hoon Yang, Sungho Kang
An Effective Hybrid Test Data Compression Method Using Scan Chain Compaction and Dictionary-Based Scheme. ATS (2008)
Sunghoon Chun, YongJoon Kim, Sungho Kang
MDSI: Signal Integrity Interconnect Fault Modeling and Testing for SoCs. J. Electron. Test. 23 (4) (2007)
Sunghoon Chun, YongJoon Kim, Sungho Kang
High-MDSI: A High-level Signal Integrity Fault Test Pattern Generation Method for Interconnects. ATS (2007)
Sunghoon Chun, Sangwook Kim, Hong-Sik Kim, Sungho Kang
An Efficient Dictionary Organization for Maximum Diagnosis. J. Electron. Test. 22 (1) (2006)
Sunghoon Chun, YongJoon Kim, Jung-Been Im, Sungho Kang
MICRO: a new hybrid test data compression/decompression scheme. IEEE Trans. Very Large Scale Integr. Syst. 14 (6) (2006)
Jung-Been Im, Sunghoon Chun, Geunbae Kim, Jin-Ho Ahn, Sungho Kang
RAIN (RAndom Insertion) Scheduling Algorithm for SoC Test. Asian Test Symposium (2004)
YongJoon Kim, DongSub Song, YongSeung Shin, Sunghoon Chun, Sungho Kang
A New Maximal Diagnosis Algorithm for Bus-structured Systems. ITC (2003)