DiSC: A New Diagnosis Method for Multiple Scan Chain Failures.
Sunghoon ChunAlex OrailogluPublished in: IEEE Trans. Comput. Aided Des. Integr. Circuits Syst. (2010)
Keyphrases
- preprocessing
- significant improvement
- high accuracy
- theoretical analysis
- segmentation algorithm
- optimization algorithm
- synthetic data
- experimental evaluation
- high precision
- fully automatic
- pairwise
- computational complexity
- machine learning
- similarity measure
- clustering algorithm
- detection method
- evaluation method
- support vector machine svm
- image quality
- mutual information
- denoising
- support vector machine
- dynamic programming
- multiresolution
- objective function