An Efficient Scan Chain Diagnosis Method Using a New Symbolic Simulation.
Sunghoon ChunTaejin KimYongJoon KimSungho KangPublished in: VTS (2008)
Keyphrases
- mathematical model
- optimization algorithm
- high accuracy
- data sets
- objective function
- computational complexity
- preprocessing
- significant improvement
- computational cost
- highly efficient
- simulation model
- simulation study
- optimization method
- high precision
- fault diagnosis
- synthetic data
- clustering method
- computationally efficient
- support vector machine
- experimental evaluation
- dynamic programming
- cost function
- image processing