YongJoon Kim

Publication Activity (10 Years)

Years Active: 2003-2016
Publications (10 Years): 1

Top Topics

Material Handling

Dynamic Scheduling

Top Venues

IEICE Electron. Express

Publications

Taehee Lee, YongJoon Kim, Joon-Sung Yang
Temperature and voltage droop-aware test scheduling during scan shift operation. IEICE Electron. Express 13 (18) (2016)
YongJoon Kim, Jaeseok Park, Sungho Kang
Selective Scan Slice Grouping Technique for Efficient Test Data Compression. IEICE Trans. Inf. Syst. (2) (2010)
YongJoon Kim, Jaeseok Park, Sungho Kang
A Selective Scan Chain Activation Technique for Minimizing Average and Peak Power Consumption. IEICE Trans. Inf. Syst. (1) (2010)
YongJoon Kim, Jaeseok Park, Sungho Kang
Selective scan slice repetition for simultaneous reduction of test power consumption and test data volume. IEICE Electron. Express 6 (20) (2009)
YongJoon Kim, Myung-Hoon Yang, Jaeseok Park, Eunsei Park, Sungho Kang
Grouped Scan Slice Repetition Method for Reducing Test Data Volume and Test Application Time. IEICE Trans. Inf. Syst. (7) (2009)
Sunghoon Chun, YongJoon Kim, Taejin Kim, Sungho Kang
A High-Level Signal Integrity Fault Model and Test Methodology for Long On-Chip Interconnections. VTS (2009)
Sunghoon Chun, YongJoon Kim, Taejin Kim, Myung-Hoon Yang, Sungho Kang
XPDF-ATPG: An Efficient Test Pattern Generation for Crosstalk-Induced Faults. ATS (2008)
Sunghoon Chun, Taejin Kim, YongJoon Kim, Sungho Kang
An Efficient Scan Chain Diagnosis Method Using a New Symbolic Simulation. VTS (2008)
Myung-Hoon Yang, YongJoon Kim, Sunghoon Chun, Sungho Kang
An Effective Power Reduction Methodology for Deterministic BIST Using Auxiliary LFSR. J. Electron. Test. 24 (6) (2008)
Taejin Kim, Sunghoon Chun, YongJoon Kim, Myung-Hoon Yang, Sungho Kang
An Effective Hybrid Test Data Compression Method Using Scan Chain Compaction and Dictionary-Based Scheme. ATS (2008)
Sunghoon Chun, YongJoon Kim, Sungho Kang
MDSI: Signal Integrity Interconnect Fault Modeling and Testing for SoCs. J. Electron. Test. 23 (4) (2007)
Sunghoon Chun, YongJoon Kim, Sungho Kang
High-MDSI: A High-level Signal Integrity Fault Test Pattern Generation Method for Interconnects. ATS (2007)
Sunghoon Chun, YongJoon Kim, Jung-Been Im, Sungho Kang
MICRO: a new hybrid test data compression/decompression scheme. IEEE Trans. Very Large Scale Integr. Syst. 14 (6) (2006)
YongJoon Kim, Myung-Hoon Yang, Youngkyu Park, Daeyeal Lee, Sungho Kang
An Effective Test Pattern Generation for Testing Signal Integrity. ATS (2006)
YongJoon Kim, Hyun-Don Kim, Sungho Kang
A new maximal diagnosis algorithm for interconnect test. IEEE Trans. Very Large Scale Integr. Syst. 12 (5) (2004)
Hong-Sik Kim, YongJoon Kim, Sungho Kang
Test-decompression mechanism using a variable-length multiple-polynomial LFSR. IEEE Trans. Very Large Scale Integr. Syst. 11 (4) (2003)
YongJoon Kim, DongSub Song, YongSeung Shin, Sunghoon Chun, Sungho Kang
A New Maximal Diagnosis Algorithm for Bus-structured Systems. ITC (2003)