MDSI: Signal Integrity Interconnect Fault Modeling and Testing for SoCs.

Sunghoon Chun YongJoon Kim Sungho Kang

Published in: J. Electron. Test. (2007)

Keyphrases

signal processing
high speed
fault model
non stationary
modeling language
impulse response
neural network
test set
frequency domain
ecg signals
radio frequency
signal detection