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MDSI: Signal Integrity Interconnect Fault Modeling and Testing for SoCs.
Sunghoon Chun
YongJoon Kim
Sungho Kang
Published in:
J. Electron. Test. (2007)
Keyphrases
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signal processing
high speed
fault model
non stationary
modeling language
impulse response
neural network
test set
frequency domain
ecg signals
radio frequency
signal detection