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Selective scan slice repetition for simultaneous reduction of test power consumption and test data volume.
YongJoon Kim
Jaeseok Park
Sungho Kang
Published in:
IEICE Electron. Express (2009)
Keyphrases
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test data
power consumption
low power
test cases
power reduction
power saving
power management
test set
training data
energy efficiency
battery life
data center
training set
data sets
battery powered
training and test data
cross validation
low cost
query language
active learning
support vector
low power consumption