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Temperature and voltage droop-aware test scheduling during scan shift operation.

Taehee LeeYongJoon KimJoon-Sung Yang
Published in: IEICE Electron. Express (2016)
Keyphrases
  • scheduling algorithm
  • electric field
  • power system
  • dynamic scheduling
  • round robin
  • electrical power
  • resource allocation
  • test data
  • flexible manufacturing systems
  • material handling
  • high voltage