A New Wafer Level Latent Defect Screening Methodology for Highly Reliable DRAM Using a Response Surface Method.
Junghyun NamSunghoon ChunGibum KooYanggi KimByungsoo MoonJonghyoung LimJaehoon JooSangseok KangHoonjung KimKyeongseon ShinKisang KangSungho KangPublished in: ITC (2008)