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A New Wafer Level Latent Defect Screening Methodology for Highly Reliable DRAM Using a Response Surface Method.

Junghyun NamSunghoon ChunGibum KooYanggi KimByungsoo MoonJonghyoung LimJaehoon JooSangseok KangHoonjung KimKyeongseon ShinKisang KangSungho Kang
Published in: ITC (2008)
Keyphrases
  • highly reliable
  • theoretical analysis
  • image analysis
  • k means
  • model selection
  • regression analysis