Near-Threshold-at-Gate based Test for Stuck-on Fault in Scan-chain Testing.
Haripriya R. SSoumitro VyapariJaynarayan T. TuduPublished in: VLSID (2024)
Keyphrases
- test cases
- test sequences
- test generation
- software testing
- test data
- integration testing
- statistical tests
- test suite
- testing process
- test case generation
- fault diagnosis
- model based testing
- fault detection
- fault model
- multiple faults
- case study
- data sets
- fault injection
- set of test cases
- regression testing
- test set
- markov chain
- fuzzy logic
- artificial intelligence
- neural network