Extended metallization reliability testing: Combining standard wafer level with product tests to increase test sensitivity.
V. BornM. BeckO. BosholmD. DalleauS. GlenzI. HaverkampG. KurzF. LangeA. VestPublished in: Microelectron. Reliab. (2009)
Keyphrases
- test cases
- code coverage
- test generation
- test suite
- software testing
- statistical tests
- test data
- integrated circuit
- regression testing
- software reliability
- number of test cases
- model based testing
- life cycle
- item response theory
- test sequences
- testing process
- test statistic
- test case generation
- integration testing
- software systems
- diagnostic tests
- confidence levels
- manufacturing process
- set of test cases
- test data generation
- high sensitivity
- neural network
- product quality
- levels of abstraction
- test set
- higher level
- software development
- failure rate
- sensitivity analysis
- statistically significant